Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles Volume 166 (Hardcover)

Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles Volume 166 By Peter W. Hawkes (Editor) Cover Image
By Peter W. Hawkes (Editor)
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Description


Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Product Details
ISBN: 9780123813107
ISBN-10: 0123813107
Publisher: Academic Press
Publication Date: June 21st, 2011
Pages: 752
Language: English
Series: Advances in Imaging and Electron Physics